P6_22: ARIA: Additive Components for Hardware Reliability, Integrity, and Aging Monitoring
Topic Areas: New Approaches to Secure On-Shore Microelectronics Design and Manufacturing, AI Hardware Trojan Mitigation
Principal investigator: Dr. Rashmi Jha, University of Cincinnati
Real-time and continuous monitoring of Integrity, Aging, and Reliability of Integrated Circuits (ICs) during entire life-cycle is critical for trusted and secured microelectronics assurance. Currently available aging monitoring approaches using Ring Oscillators (RO) and Razor Circuitries suffer from limitations. The objective of this project is to develop additively integrated emerging non-volatile memory (NVM) devices such as Resistive Random Access Memory (RRAM) based self-encrypted circuitries, and Ferroelectric Field Effect Transistors (FeFET) for Integrity, Reliability, and Aging monitoring over the entire life-cycle of ICs. Being NVMs with unique device physics, these devices offer tremendous opportunities for developing low area, energy, and delay overheads monitors. Once the accelerated aging based attacks due to Trojans and compromised process technology is detected, our approach will also provide solutions for mitigating the attacks through adaptive voltage and frequency controls resulting in resilient-systems. Thermal simulations will be used to identify sensor placement strategies. Design of additive monitoring components with CMOS dies will be integrated in Electronic Design Automation (EDA) tools. Finally, on-chip machine learning techniques will be developed for analyzing data from these monitors for assurance in future.